Data Compression for System-on-Chip Testing Using ATE

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Farzin Karimi,Waleed Meleis,Zainalabedin Navabi,Fabrizio Lombardi

DFT

published 1st of January, 2002

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HuggingPeers ID: ID hpp-YNaO4Qv3Zyq
Publication: DFT
Published: 1st of January, 2002

Provenance 1

Source	ID	Citations
DBLP	conf/dft/KarimiMNL02	—

Cite this paper

@article{karimi2002,
  title = {Data Compression for System-on-Chip Testing Using ATE},
  author = {Farzin Karimi and Waleed Meleis and Zainalabedin Navabi and Fabrizio Lombardi},
  journal = {DFT},
  year = {2002},
  month = {Jan},
  doi = {10.1109/dftvs.2002.1173513},
  url = {https://doi.org/10.1109/dftvs.2002.1173513},
}

Farzin Karimi et al. (2002). Data Compression for System-on-Chip Testing Using ATE. DFT. https://doi.org/10.1109/dftvs.2002.1173513

Farzin Karimi, et al.. "Data Compression for System-on-Chip Testing Using ATE." DFT, 2002, https://doi.org/10.1109/dftvs.2002.1173513.

Farzin Karimi, et al.. "Data Compression for System-on-Chip Testing Using ATE." DFT (2002). https://doi.org/10.1109/dftvs.2002.1173513

Farzin Karimi et al., 2002. Data Compression for System-on-Chip Testing Using ATE. DFT. Available at: <https://doi.org/10.1109/dftvs.2002.1173513>.

TY  - JOUR
TI  - Data Compression for System-on-Chip Testing Using ATE
AU  - Farzin Karimi
AU  - Waleed Meleis
AU  - Zainalabedin Navabi
AU  - Fabrizio Lombardi
PY  - 2002
JO  - DFT
DO  - 10.1109/dftvs.2002.1173513
UR  - https://doi.org/10.1109/dftvs.2002.1173513
ER  -